발행물
컨퍼런스
APS March Meeting 2022
2022
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Atomically sharp edges revealed in a self-folded graphene nanostructure
APS March Meeting 2020
2020
Thermal drift induced artifacts in AFM atomic lattice images*
EMC 2019 (Electronic Materials Conference 2019)
2019
Graphene Self-folding by AFM Scanning
Atomic-level friction imaging of graphene and TMD materials via lateral force microscopy in ambient conditions
8th International Conference on Spectroscopic Ellipsometry
Application of comparison imaging ellipsometry to crystallization of indium oxide thin films