발행물
컨퍼런스
2019 International conference on planarization/CMP technology (ICPT 2019)
2018
,
Effects of Dispersants on Particle Size Distribution and Chemical Mechanical Polishing Process_Eungchul Kim, Jaewon Lee, Gunhoo Woo, Taesung Kim (Oral Presentation)
Investigation of Colloidal Silica Slurry with Mixed Particles of Different Sizes in Cu CMP_Juhwan Kim, Seokjun Hong, Chulwoo Bae and Taesung Kim (Oral Presentation)
Application of Scanning Mobility Particle Sizer for Measurement of Slurry Abrasive Size_Donggeon Kwak, Jinil Cho, Hyunho Seok, Taesung Kim (Oral Presentation)
Optimization of Water Polishing for an Improved Abrasive Removal_Seokjun Hong, Juhwan Kim, Johee Won, Vinit Kanade, Taesung Kim, Yutaka Wada, Satomi Hamada, Hirokuni Hiyama (Oral Presentation)
A Numerical Study on Slurry Flow with CMP Pad Grooves_Seokjun Hong, Johee Won, Hojoong Kim, Vinit Kanade, Taesung Kim (Oral Presentation)