강정원 교수 연구실
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·2026
Highly sensitive indirect X-ray detector using an ultrasonically exfoliated MoS <sub>2</sub> monolayer in the active layer
Chanyeol Lee, Jehoon Lee, Jaewon Son, Jungwon Kang
IF 5.1Journal of Materials Chemistry C
초록
Exfoliated 25 nm MoS 2 monolayers uniformly dispersed in a PBDB-T:ITIC X-ray detector increased sensitivity by enhancing carrier transport (mobility, carrier lifetime) characteristics and reducing defect density.
키워드
MonolayerDetectorLayer (electronics)Active layerSensitivity (control systems)