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구성원
Article|
·
인용수 6
·2020
Active Contour Method Based Sub-pixel Critical Dimension Measurement of Thin Film Transistor Liquid Crystal Display (TFT-LCD) Patterns
Jeong Hoon Lee, Tai-Wook Kim, Dong Hun Ku, Heui Jae Pahk
IF 2.106 (2020) International Journal of Precision Engineering and Manufacturing
키워드
Thin-film transistorLiquid-crystal displayPixelTransistorDimension (graph theory)Materials scienceContour lineOptoelectronicsComputer graphics (images)Computer science
타입
Article
IF / 인용수
2.106 / 6
원문
https://doi.org/10.1007/s12541-019-00314-7
게재 연도
2020