권범선 교수 연구실
article|
hybrid
·인용수 0
·2025
Incidence and root cause analysis of near‐miss events in medical device use errors in intensive care units using Ishikawa diagram
Su Mi Seong, Hyeop Oh, Jae Suk Park, Su Hyun Bae, Ki Chang Nam, Sung Yun Park, Bum Sun Kwon, Bo Hae Kim
IF 1.6Japan Journal of Nursing Science
초록
The study highlights the importance of improving working conditions, updating outdated equipment, and strengthening educational programs to reduce MUEs and improve patient safety in ICUs.
키워드
Root causeRoot cause analysisIncidence (geometry)Medical deviceIntensive careRoot (linguistics)Intensive care unitPatient safety