This brief presents the on-chip background offset and timing-skew calibration of the 1-then-2b/cycle time-interleaved successive-approximation-register analog-to-digital converter (TI SAR ADC). For timing-skew between sub-ADC’s sampling clocks, a comparator offset-based window detector (WD) is used to adjust the clock edge misalignment. In addition, comparator offset calibration is considered both in terms of 1) global offset (between the offset-free reference comparator and the local reference comparator in each sub-ADC) and 2) local offset (between the local reference comparator and the rest of the comparators in the same sub-ADC). The proposed calibration sufficiently suppresses noise floor and spurs, and all calibrations are performed in the background without interfering with normal ADC operation. The prototype 5-way TI SAR ADC is fabricated in a 28 nm CMOS process and occupies a 0.03 mm2 area including on-chip calibration. With the proposed calibration, the prototype achieves SNDR of 40 dB at Nyquist input and consumes 7.57 mW, leading to the Walden figure of merit ( <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">${\text {FoM}_{W}}$ </tex-math></inline-formula> ) of 37.2 fJ/conversion-step.