조승룡 교수 연구실
article|
인용수 1
·2025
A diffusion model-based dual domain approach for CT metal artifact reduction
Sang Hyun, D. H. Choi, Sung‐Ho Yun, Randall T. Moon, Seungryong Cho
키워드
Artifact (error)Reduction (mathematics)Dual (grammatical number)DiffusionComputer scienceDomain (mathematical analysis)Materials scienceArtificial intelligenceMathematicsPhysics