조승룡 교수 연구실
article|
인용수 9
·2016
Fourier Analysis of Noise Characteristics in Cone-Beam Microtomography Laboratory Scanners
Sun Young Jang, Ho Kyung Kim, Hanbean Youn, Seungryong Cho, Ian A. Cunningham
IF 4.5IEEE Transactions on Biomedical Engineering
초록
The results of our study could be helpful in developing x-ray microtomography systems based on flat-panel detectors.
키워드
Optical transfer functionOpticsNoise (video)MagnificationFlat panel detectorNyquist frequencyDetective quantum efficiencyImaging phantomDetectorSignal-to-noise ratio (imaging)