장병철 교수 연구실
article|
인용수 10
·2025
Material engineering to enhance reliability in 3D NAND flash memory
Ki Han Kim, Namju Kim, Yeong Kwon Kim, H. S. Kim, HakJune Oh, C. Kim, Hyeun Woo Shin, M Kim, Won Choi, Byung Chul Jang
IF 8Device
키워드
Flash (photography)Reliability (semiconductor)Flash memoryComputer scienceNAND gateReliability engineeringEmbedded systemEngineeringLogic gateArt