발행물
컨퍼런스
KSNVE conference
1970
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Wafer Failure Map Retrieval using Multiple Global Descriptors
Unsupervised Fault Clustering Method using Adversarial Autoencoder and Gaussian Mixture Model
Anomaly Detection in Planetary Gear via Generative Deep Learning Model using Short Time Fourier Transformation with Order Representation
KSME conference
Recent Trends in Physics-informed Deep Learning
Weakly Supervised Microstructure Segmentation via Scribble Annotations