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181
Epitaxial Si/Si(001) thin films obtained by solid phase crystallization
Kim H.J., Jeon S.H., Jeon T.Y., Noh D.Y.
Journal of Vacuum Science and Technology A, 200407
182
Kinetic roughening of ion-sputtered Pd(001) surface: Beyond the Kuramoto-Sivashinsky model
Kim, TC, Ghim, CM, Kim, HJ, Kim, DH, Noh, DY, Kim, ND, Chung, JW, Yang, JS, Chang, YJ, Noh, TW, Kahng, B, Kim, JS
PHYSICAL REVIEW LETTERS, 200406
183
Structural properties of a thallium-induced Si(111)-1x1 surface
H.J. Kim, N.D. Kim, J.W. Chung, C.G. Hwang, T.C. Kim, D.Y. Noh
Physical Review B - Condensed Matter and Materials Physics, 200405
184
Pseudohexagonal commensurate phase at Co/Si(111) interface
T.S. Kang, J.H. Je, H.J. Kim, D.Y. Noh, N.D. Kim, J.W. Chung
Applied Physics Letter, 200201
185
Structural study of a commensurate phase at Co/Si(111) interface using in situ surface x-ray scattering
Kang, TS, Je, JH, Kim, HJ, Noh, DY, Kim, ND, Chung, JW
APPLIED PHYSICS LETTERS, 2002
186
Characteristics of Y2O3 films on Si(111) grown by oxygen-ion beam-assisted deposition
H.J. Kim, M.-H. Cho, D.-H. Ko, J.G. Seo, S.W. Whangbo, K. Jeong, J.W. Jyo, C.N. Whang, D.Y. Noh
THIN SOLID FILMS, 200102
187
Structural and electrical characteristics of Y2O3 films on oxidized Si(100) surface
H. J. Kim, M.-H. Cho, D.-H. Ko, Y. G. Choi, K. Jeong, I. W. Lyo, D. Y. Noh, C. N. Whang
Journal of Vacuum Science and Technology A, 200101
188
Thickness dependence of Y2O3 films grown on an oxidized Si surface
Cho M.-H., Choi Y.K., Lyo I.W., Jeong K., Whang C.N., Ko D.-H., Kim H.J., Noh D.Y.
Journal of Vacuum Science and Technology A, 200101
189
Evolution of surface morphology during Fe/Si(111) and Fe/Si(001) heteroepitaxy
Kim, HJ, Noh, DY, Je, JH, Hwu, Y
PHYSICAL REVIEW B, 1999
190
Precursor Control for Air-Processable Anti-Solvent-Free Perovskite Photovoltaic Cells in High-Humidity Condition
이경민, 김효정
APPLIED SCIENCE AND CONVERGENCE TECHNOLOGY, 202409
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