발행물

전체 논문

332

221

Investigation into the effect of the variation of gate dimensions on program characteristics in 3D NAND flash array
Joo Yun Seo, Yoon Kim, Se Hwan Park, Wandong Kim, Do-Bin Kim, Jong‐Ho Lee, Hyungcheol Shin, Byung‐Gook Park
2012

222

The Quality of Life of North Korean: Current Status and Understanding
Kim Soo, Kim Kook Shin, Yoon Kim, Lim Soon Hee, Jeong Eun Mee, Park Young Ja
Korea Institute for National Unification eBooks, 2012

223

A Fault-tolerant Mutual Exclusion Algorithm in Asynchronous Distributed Systems
Yoon Kim
International Journal of Contents, 2012

224

Method to Mitigate Threshold Voltage and ON-Cell Current Variation Caused by Cell Gate Length Fluctuation in NAND Flash Memory with Virtual Source and Drain
Wandong Kim, Yoon Kim, Sehwan Park, Joo Yun Seo, Do Bin Kim, Byung‐Gook Park
대한전자공학회 학술대회, 2012

225

Bitline separated gated multi-bit (BS-GMB) SONOS for high density flash memory
Won‐Bo Shim, Seunghyun Kim, Yoon Kim, Se Hwan Park, Sungjun Kim, Euyhwan Park, Byung‐Gook Park
2012

226

Super Resolution Algorithm Based on Edge Map Interpolation and Improved Fast Back Projection Method in Mobile Devices
Doo‐Hee Lee, Dae-Hyun Park, Yoon Kim
KIPS Transactions on Software and Data Engineering, 2012

227

모바일 환경을 위해 에지맵 보간과 개선된 고속 Back Projection 기법을 이용한 Super Resolution 알고리즘
이두희, 박대현, Yoon Kim
정보처리학회논문지. 소프트웨어 및 데이터 공학, 2012

228

Stacked Gated Twin-Bit (SGTB) SONOS Memory Device for High-Density Flash Memory
Won‐Bo Shim, Seongjae Cho, Jung Hoon Lee, Dong Hua Li, D. Kim, Gil Sung Lee, Yoon Kim, Se Hwan Park, Wandong Kim, Jungdal Choi, Byung‐Gook Park
IEEE Transactions on Nanotechnology, 2011

229

Comparative Analysis of Trap-Based Program/Erase Behaviors with Different Tunnel Barriers
Dong Hua Li, Yoon Kim, D. Kim, Gil Sung Lee, Byung‐Gook Park
Journal of Nanoscience and Nanotechnology, 2011

230

Single-Crystalline Si STacked ARray (STAR) NAND Flash Memory
김윤, 심원보, 박병국, 신형철, 이종호, 김가람, 윤장근, 이정업, 이종덕
IEEE TRANSACTIONS ON ELECTRON DEVICES, 2011