발행물
컨퍼런스
International Conference on Simulation of Semiconductor Processes and Devices
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Solving Boltzmann transport equation without Monte-Carlo Algorithms ? New methods for industrial TCAD applications
한국반도체학술대회
Statistical analysis of dark random noise in CMOS image sensors based on the Green’s function approach
Oxide-trapping model for physics-based 1/f noise analysis in MOSFETs
Noise simulation of mesoscopic device based on the non-equilibrium Green’s function formalism
Shot noise in homogeneous semiconductors