발행물
컨퍼런스
2025 12th International Conference on Industrial Engineering and Applications
2025
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Improving Calibration for Safe Semi-supervised Learning Under Label Distribution Mismatch
The Methodology for predicting Final Temperature of Molten Steel in the Steelmaking Converter Process
Hierarchical Attention-Based Yield Prediction Model Using Wafer Process Progression Data in Semiconductor Manufacturing
Open-Set Semi-Supervised Learning with Trainable Open-Set Probability Model for Image Classification
2024 Korea Data Mining Society
2024
Input-guidance Diffusion Model for Unknown Defect Patterns Detection in Wafer Bin Map