Fabrication and defect-driven analysis of CMOS inverters using SnOx/ZnO TFTs: Implications for balanced performance
Viswanath G. Akkili, Sanghyun Jeong, Frederick Aziadzo, Ashish A. Patil, Minjae Sung, Jung‐Sub Wi, Joon Sik Park, Hoon‐Hwe Cho, Choong‐Heui Chung, Jong Beom Ko, Dong‐Eun Kim, Eui‐Tae Kim, Jun‐Hui Choi, R. Thangavel, Jae‐Hyun Lee, Sangyeob Lee