발행물
컨퍼런스
Korean Institute of Industrial Engineers (KIIE) Fall Conference
2023
,
Attendance by Prof.Hur and three graduate students (Changjin Lim, Jaehyeop Hong and Wonhee Lee)
2024년 대한산업공학회 추계학술대회
2024
Self Supervised Anomaly Detection using Outliers for Multivariate Time Series
TripletMatch:Wafer Map Defect Detection Using Semi-Supervised Learning and Triplet Loss with Mixup
A Robust Auto Labeling Framework with Noisy Labels Using Transition Matrix
2024년 공학교육 학술대회
AI를 이용한 섬유 원사 품질 모니터링 자동화