발행물
컨퍼런스
European Solid-State Device Research Conference (ESSDERC)
2010
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Tri-Gate Bulk CMOS Technology for Improved SRAM Scalability
IEEE International Symosium on Circuits and Systems (ISCAS)
SRAM Design in Fully-Depleted SOI Technology
IEEE International Reliability Physics Symposium (IRPS)
Analysis of the Relationship between Random Telegraph Signal and Negative Bias Temperature Instability
2010 International Symposium on VLSI Technology, Systems, and Applications (VLSI-TSA)
Segmented Tri-Gate Bulk CMOS Technology for Device Variability Improvement
IEEE International SOI Conference
2009
SRAM Yield Enhancement with Thin-BOX FD-SOI