발행물
컨퍼런스
International symposium on quality electronic design (ISQED)
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New Word-line Driving Scheme for Suppressing Oxide-Tunneling Leakage in Sub-65-nm SRAMs
IEEK
Embedded Pseudo SRAM with 320x120x18 Bits and Dual I/O Ports for Display IC
Power-Efficient Dickson-Based Charge Pump Circuit without Output Voltage Loss
Level shifter circuit with fast delay and low-power consumption
IEEE
Comparative study on SRAMs for suppressing both oxide0tunneling leakage and subthreshold leakage in sub-70-nm leakage dominant VLSIs