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204

81

Contact­Engineered Electrical Properties of MoS2 Field­Effect Transistors via Selectively Deposited Thiol­Molecules
이탁희, 최유리, 신지원, 김태영, 강기훈, 김재근, 박진수, 조경준, 정승준
Advanced materials, 2018

82

Highly Reliable Superhydrophobic Protection for Organic Field-Effect Transistors by Fluoroalkylsilane-Coated TiO2 Nanoparticles
D. Yoo, Y. Kim, M. Min, G. H. Ahn, D-H. Lien, J. Jang, H. Jeong, Y. Song, S. Chung*, A. Javey, T. Lee*
ACS Nano, 2018

83

Artificial Soft Elastic Media with Periodic Hard Inclusions for Tailoring Strain-Sensitive Thin Film Responses
J. Byun, S. Chung*, Y. Hong*
Advanced Materials, 2018

84

Two-Dimensional Thickness-Dependent Avalanche Breakdown Phenomena in MoS2 Field-Effect Transistors under High Electric Fields
J. Pak, Y. Jang, J. Byun, K. Cho, T.-Y. Kim, J.-K. Kim, B. Y. Choi, J. Shin, Y. Hong, S. Chung*, T. Lee*
ACS Nano, 2018

85

Contact‐Engineered Electrical Properties of MoS2 Field‐Effect Transistors via Selectively Deposited Thiol‐Molecules
K. Cho, J. Pak, J.‐K. Kim, K. Kang, T.‐Y. Kim, J. Shin, B. Y. Choi, S. Chung*, T. Lee*
Advanced Materials, 2018

86

Highly Improved Switching Properties in Flexible Aluminum Oxide Resistive Memories Based on a Multilayer Device Structure
J. Jang, H‐H. Choi, S. H. Paik, J. K. Kim, S. Chung, J. H. Park*
Advanced Electronic Materials, 2018

87

Electronic Skins for Soft, Compact, Reversible Assembly of Wirelessly Activated Fully Soft Robots
J. Byun, Y. Lee, J. Yoon, B. Lee, E. Oh, S. Chung, T. Lee, K.-J. Cho, J. Kim, Y. Hong*
Science Robotics, 2018

88

Effects of Electron Beam Irradiation and Thiol Molecule Treatment on the Properties of MoS2 Field Effect Transistors ​
B. Y. Choi, K. Cho, J. Pak, T.-Y. Kim, J.-K. Kim, J. Shin, J. Seo, S. Chung, T. Lee*
Journal of the Korean Physical Society, 2018

89

Impact of Device Area and Film Thickness on Performance of Sol-Gel Processed ZrO2 RRAM ​
S. Lee, T. Kim, B. Jang, W.-Y. Lee, K. C. Song, H. S. Kim, G. Y. Do, S. B. Hwang, S. Chung, J. Jang*
IEEE Electron Device Letters, 2018

90

Analysis of noise generation and electric conduction at grain boundaries in CVD-grown MoS<sub>2</sub> field effect transistors
정승준
NANOTECHNOLOGY, 2017