발행물

전체 논문

255

201

Nitridation of sapphire substrate and its effect on the growth of GaN layer at low temperature
Paek, JS[Paek, JS], Kim, KK[Kim, KK], Lee, JM[Lee, JM], Kim, DJ[Kim, DJ], Yi, MS[Yi, MS], Noh, DY[NOH, DO YOUNG], Kim, HG[Kim, HG], Park, SJ[PARK, SEONG JU]
JOURNAL OF CRYSTAL GROWTH, 199904

202

Amorphous, silicide, and crystalline Fe films grown on Si(001) by radio-frequency magnetron sputtering
Je, JH[Je, JH], Kim, HK[Kim, HK], Noh, DY[NOH, DO YOUNG]
JOURNAL OF MATERIALS RESEARCH, 199904

203

Microstructure of epitaxial alpha-Fe2O3 grains in Ba-ferrite thin films grown on sapphire (001)
Cho, TS[Cho, TS], Doh, SJ[Doh, SJ], Je, JH[Je, JH], Noh, DY[NOH, DO YOUNG]
APPLIED PHYSICS LETTERS, 199904

204

Microstructures of GaN1-xPx layers grown on (0001)GaN substrates by gas source molecular beam epitaxy
Seong, TY[SEONG, TAE YEON], Bae, IT[Bae, IT], Choi, CJ[Choi, CJ], Noh, DY[NOH, DO YOUNG], Zhao, Y[Zhao, Y], Tu, CW[Tu, CW]
JOURNAL OF APPLIED PHYSICS, 199903

205

Evolution of surface morphology during Fe/Si(111) and Fe/Si(001) heteroepitaxy
Kim, H.J.[Kim, H.J.], Noh, D.Y.[NOH, DO YOUNG], Je, J.H.[Je, J.H.], Hwu, Y.[Hwu, Y.]
PHYSICAL REVIEW B, 199902

206

The development and application of imaging EXAFS spectromicroscopy
Hwu, Y[Hwu, Y], Tsai, WL[Tsai, WL], Chang, LW[Chang, LW], Chen, CH[Chen, CH], Wu, CC[Wu, CC], Noh, DY[NOH, DO YOUNG], Je, JH[Je, JH], Fecher, GH[Fecher, GH], Bertolo, M[Bertolo, M], Berger, H[Berger, H], Margaritondo, G[Margaritondo
JAPANESE JOURNAL OF APPLIED PHYSICS, 1999

207

Iron-oxide interlayer existing in Ba-ferrite/sapphire(001) films grown by sputtering
Cho, TS[Cho, TS], Doh, SJ[Doh, SJ], Je, JH[Je, JH], Noh, DY[NOH, DO YOUNG]
JAPANESE JOURNAL OF APPLIED PHYSICS, 1999

208

Synchrotron x-ray scattering study of the strain evolution in thin AlN/Sapphire(0001) films
Kang, HC[Kang, HC], Seo, SH[Seo, SH], Noh, DY[NOH, DO YOUNG]
JAPANESE JOURNAL OF APPLIED PHYSICS, 1999

209

Structure determination of nanostructured Ni-Co films by anomalous x-ray scattering
Chow, G.M.[Chow, G.M.], Goh, W.C.[Goh, W.C.], Hwu, Y.K.[Hwu, Y.K.], Cho, T.S.[Cho, T.S.], Je, J.H.[Je, J.H.], Lee, H.H.[Lee, H.H.], Kang, H.C.[Kang, H.C.], Noh, D.Y.[NOH, DO YOUNG], Lin, C.K.[Lin, C.K.], Chang, W.D.[Chang, W.D.]
APPLIED PHYSICS LETTERS, 1999

210

Structural Determination of Nanostructured Ni-Co Films by Anomalous X-ray Scattering
NOH, DO YOUNG[NOH, DO YOUNG]
APPLIED PHYSICS LETTERS, 1999