발행물

전체 논문

255

21

Effect of growth interruption and the introduction of H2 on the growth of InGaN/GaN multiple quantum wells
Yong-Tae Moon, Dong-Joon Kim, Keun-Man Song, Dong-Wan Kim, Min-Su Yi, Do-Young Noh, Seong-Ju Park
J. Vac. Sci. Technol. B, 2000

22

Formation of crystalline Ba-ferrite phase from alpha-Fe2O3 phase in amorphous precursor
Tae Sik Cho, Jung Ho Je, Do Young Noh
Appl. Phys. Lett., 2000

23

Structural evolution of GaN during initial stage MOCVD growth
Chong Cook Kim, Jung Ho Je, Min-Su Yi, Do Young Noh
MRS Proceedings, 1999

24

Crystallization of amorphous precursor of Ba-ferrite film: a real-time synchrotron x-ray scattering study
Seok Joo Doh, Jung Ho Je, Do Young Noh, Tak Jean Moon
IEEE TRANSACTIONS ON MAGNETICS, 1999

25

Coherence based contrast enhancement in x-ray radiography with a photoelectron microscope
Y. Hwu, B. Lai, D. C. Mancini, J. H. Je, D. Y. Noh, M. Bertolo, G. Tromba, G. Margaritondo
Appl. Phys. Lett., 1999

26

Structure Determination of Nanostructured Ni-Co Films by Anomalous X-ray Scattering
G. M. Chow, W. C. Goh, Y. K. Hwu, T. S. Cho, J. H. Je, H. H. Lee, H. C. Kang, D. Y. Noh, C. K. Lin, W. D. Chang
Appl. Phys. Lett., 1999

27

Effects of growth temperature on GaN nucleation layers
M. S. Yi, H. H. Lee, D. J. Kim, S. J. Park, D. Y. Noh, C. C. Kim, J. H. Je
Appl. Phys. Lett., 1999

28

Use of Photoelectron Microscopes as X-ray Detectors for Imaging and Other Applications
Y. Hwu, W.L. Tsai, B. Lai, D.C. Mancini, J.H. Je, D.Y. Noh, H.S. Youn, C.S. Hwang, F. Cerrina, W. Swiech, M. Bertolo, G. Tromba, G. Margaritondo
Nuclear Instruments & Methods in Physics Research Section a-Accelerators Spectrometers Detectors and Associated Equipment, 1999

29

Coherence-enhanced synchrotron radiology: Refraction versus diffraction mechanisms
Hsieh. H. H, Lu. M. J, Tsai. W. L, Lin. H. M, Goh. W. C, Lai. B, Je. J. H, Kim. C. K, Noh. D. Y, Youn. H. S, Tromba. G, Margaritondo. G
J. Appl. Phys., 1999

30

Thickness dependence of the crystallization of Ba-ferrite films
T. S. Cho, S. J. Doh, J. H. Je, D. Y. Noh
J. Appl. Phys., 1999