발행물

전체 논문

54

21

Unintended Carbon-related Impurity and Negative Bias Instability in High-Mobility Oxide TFTs
Y. Shiah, K. Sim, S. Ueda, M. Sasase, J. Kim*, H. Hosono*
IEEE Electron Device Letter, 2021

22

High-Performance IGTO Transistors with an Al2O3 Gate Insulator Deposited by ALD at the Low Temperature of 150 °C: Role of Hydrogen and Excess Oxygen in the Al2O3 Dielectric Film
C. Choi, T. Kim, S. Ueda, Y. Shiah, H. Hosono, J. Kim*, J. Jeong*
ACS Applied Materials & Interfaces, 2021

23

Highly Dense and Stable p-type TFT Based on ALD-SnO Fabricated by Two-Step Crystallization
H. Kim, S. Choi, H. Jeong, J. Lee, J. Kim*, J. Park*
ACS Applied Materials & Interfaces, 2021

24

Engineering Copper Iodide (CuI) for Multifunctional p-TypeTransparent Semiconductors and Conductors
A. Liu, H. Zhu, M. Kim, J. Kim, Y. Noh*
Advanced Science, 2021

25

Implementing room-temperature fabrication of flexible amorphous Sn-Si-O TFTs via defect controls
X. Liu, J. Zhang, Y. Shiah, J. Kim*, H. Ning*, K. Lu, X. Cao, W. Xu, R. Yao*, J. Peng
Advanced Materials Interfaces, 2021

26

Origins of the coloration from structure and valence state of bismuth oxide glasses
A. Saitoh* et al.
Journal of Non-Crystalline Solids, 2021

27

Origin of metallic nature of Na3N anti-perovskite
H. Mizoguchi*, S Park, T. Katase, G. Bazhenin, J. Kim, H. Hosono*
Journal of the American Chemical Society, 2021

28

Boosting Carrier Mobility and Stability in Indium-Zinc-Tin Oxide Thin-Film Transistors through Controlled Crystallization
N. On, B. Kim, Y. Kim, E. Kim, J. Lim, H. Hosono, J. Kim*, H. Yang*, J. Jeong*
Scientific Report, 2020

29

Improved polaronic transport under a strong Mott-Hubbard interaction in Cu-substituted NiO
S. Park, K. Lee, J. Lee, G. Bang, J. Kim, H. Park, M. Oh, S. Lee, Y. Kim, Y. Kim, H. Hosono, J. Bang*, K. Lee*
Inorganic Chemistry Frontiers, 2020

30

One-Step Solution Synthesis of White-Light-Emitting Films via Dimensionality Control of the Cs–Cu–I System
T. Jun, T. Handa, K. Sim, S. Iimura, M. Sasase, J. Kim*, Y. Kanemitsu, H. Hosono*
APL Materials, 2019