JEM-ARM200F NEOARM / Jeol

aberration corrected (S)TEM @CCRF

Fusion Select / Protochips

In-situ electrothermal TEM holder (Heating + Biasing) with AXON Synchronicity module

Focused Ion Beam / FEI, Helios G5 CX

Transmission Electron Microscope (JEM-2100F) @CCRF

JEM-2010 / Jeol

TEM @ECEP

Focused Ion Beam / FEI, Helios G3 CX @ CCRF

FE-EPMA / Jeol JXA-8530F Plus @ CCRF

JSM-5610 / Jeol

Normal SEM with EDS

SU5000 / Hitach

FE-SEM with EDS/EBSD @Core center

JSM-7900F / Jeol

FE-SEM with EDS @ECEP