발행물

전체 논문

527

351

Phase Behavior of a Weakly Interacting Block Copolymer by Temperature-Dependent FTIR Spectroscopy
H. J. Kim, S. B. Kim, J. K. Kim, Y. M. Jung, D. Y. Ryu, K. A. Lavery, T. P. Russell
Macromolecules, 2006

352

Fabrication of Densely packed, well-ordered, high-aspect-ratio Silicon Nanopillars over large areas using Block Copolymer Lithography
V. Gowrishankar, N. Miller, M. D. McGehee, M. J. Misner, D. Y. Ryu, T. P. Russell, E. Drockenmuller, C. J. Hawker
Thin Solid Films, 2006

353

Swelling and Shrinkage of Lamellar Domain of Conformationally Restricted Block Copolymers by Metal Chloride
D. H. Lee, H. Y. Kim, J. K. Kim, J. Huh, D. Y. Ryu
Macromolecules, 2006

354

Closed-Loop Phase Behavior for Weakly Interacting Block Copolymers
C. Li, D. H. Lee, J. K. Kim, D. Y. Ryu, T. P. Russell
Macromolecules, 2006

355

Selective Growth of Ge islands on Nanometer-scale Patterned SiO2/Si Substrate by Molecular Beam Epitaxy
T. S.Yoon, Z. M. Zhao, J. Liu, Y. H. Xie, D.Y. Ryu, T. P. Russell, H. M. Kim, K. B. Kim
Appl. Phys. Lett., 2006

356

Influence of Carbon Dioxide Swelling on the Closed-Loop Phase Behavior of Block Copolymers
K. A. Lavery, J. D. Sievert, J. J. Watkins, T. P. Russell, D. Y. Ryu, J. K. Kim
Macromolecules, 2006

357

Application of Principal Component Analysis-based Two-dimensional Correlation Spectroscopy to Characterization of Order?Disorder Transition of Polystyrene-block-poly(n-pentyl methacrylate) Copolymer
Y. M. Jung, H. J. Kim, D. Y. Ryu, S. B. Kim, J. K. Kim
J. of Molecular Structure, 2006

358

A Simple Approach to Determine the Equilibrium Shape and Position of Sandwiched Polymer Droplets
D. C. Hyun, U. Jeong, D. Y. Ryu
J. Polym. Sci. Part B: Polym. Phys., 2007

359

Effective Interaction Parameter for Homologous Series of Deuterated Polystyrene-block-Poly(n-alkyl methacrylate) Copolymers
D. Y. Ryu, C. Shin, J. Cho, D. H. Lee, J. K. Kim, K. A. Lavery, T. P. Russell
Macromolecules, 2007

360

Microstructure Analysis of Epitaxially Grown Self-Assembled Ge Islands on Nanometer-Scale Patterned SiO2/Si Substrates by High-Resolution Transmission Electron Microscopy
T. Yoon, H. Kim, K. Kim, D.Y. Ryu, T. P. Russell, Z. Zhao, Y. Xie
J. Appl. Phys., 2007