ECS

Resistance switching characteristics of metal oxides for nonvolatile memory application

2007

ECS

Structural and Electrical Properties of High pressure Hydrogen Post-Annealed Pt-Er Ally Metal gate on HfO2 film

2007

IEEE

Hybrid charge trap memory of TaN Nanocrystals embedded in Silicon Nitride using Phase Separation Methods

2007

IEEE

High Pressure Deuterium Annealing Effect on Nano-Scale Strained CMOS Devices

2007

IEEE

Thermal stability of metal electrodes and its impact on gate dielecric characteristics

2006