발행물
컨퍼런스
The 16th Korean Conference on Semiconductors
2020.02
,
PCI Consideration of Multiple Dielectric Layer's Equivalent Oxide Thickness(EOT) in a Cylindrical Structure
PCI Phenomenon for Sub 30nm Vertical Multi-bit SONOS Flash Memory
Multi-Bit Gated-Diode Flash Memory
Highly Scalable Three-Dimensional Two-Bit NAND-Type Flash Memory Device with Additional Cut-off Gate
Muroran nonlinear analysis seminar
2020.01
Stability of Lamb dipoles