Photonics & Ultrasonics Laboratory
성균관대학교 본교(제1캠퍼스)전자전기공학
박형원 교수
High-Energy Pulsed Raman Fiber Laser
Ultrasonic Drug Delivery
Optoacoustic Energy Conversion
발행물
전체 논문
88
11
Reversible electrical percolation in a stretchable and self-healable silver-gradient nanocomposite bilayer
J. Park, D. Seong, Y. J. Park, S. H. Park, H. Jung, Y. Kim, H. W. Baac, M. Shin, S. Lee, M. Lee, D. Son
Nature Comm., 2022
12
Epidermal Piezoresistive Structure with Deep Learning-Assisted Data Translation
C. So, J. Kim, H. Kim, H. Luan, S. Han, D. Y. Kim, Y. Oh, T.-I. Kim, H. W. Baac, J. H. Ko, S. M. Won
npj Flex. Electron., 2022
13
Wave-Mode Configurable Ultrasonic Non-Destructive Evaluation System using Optoacoustic Prism
M. A. Abbasi, H. W. Baac
IEEE Access, 2022
14
Configurable Ultrasonic Non-Destructive Evaluation System using Optoacoustic Prism
M. Sun, H. W. Baac, C. Shin
IEEE Access, 2022
15
Simulation study: The impact of structural variations on the characteristics of a buried-channel-array transistor (BCAT) in DRAM
M. Faraz, M. A. Abbasi, D. Son, C. Shin, K.-T. Lee, S. M. Won, H. W. Baac
Micromachines, 2022
16
Strain-dependent photoacoustic characteristics of free-standing carbon-nanocomposite transmitters
M. Faraz, M. A. Abbasi, D. Son, C. Shin, K.-T. Lee, S. M. Won, H. W. Baac
Sensors, 2022
17
Functional encapsulating structure for wireless and immediate monitoring of the fluid penetration
D. Lim, I. Hong, S. U. Park, J. W. Chae, S. Lee, H. W. Baac, C. Shin, J. Lee, Y. Roh, C. Im, Y. Park, G. Lee, U. Kim, J.-S. Koh, D. Kang, S. Han, S. W. Won
Adv. Funct. Mater., 2022
18
Study on memory characteristics of fin-shaped feedback field effect transistor
S. Han, Y. Kim, D. Son, H. W. Baac, S. M. Won, C. Shin
Semicond. Sci. Technol., 2022
19
Solution-processable Ag-mediated ZnO nanowires for scalable low-temperature fabrication of flexible devices
H. Choi, K. Kim, M. Kim, J. D. Kim, I. Cho, I. Kim, H. Chae, I. Han, H. Kim, J. H. Seo, H. W. Baac, I. Park, J. G. Ok
ACS Appl. Electron. Mater., 2022
20
Quantitative evaluation of line-edge roughness in various FinFET structures: Bayesian neural network with automatic model selection
S. Yu, S. M. Won, H. W. Baac, D. Son, C. Shin
IEEE Access, 2022