Energy Materials and Electron Microscopy Laboratory
한국과학기술원 본교(제1캠퍼스) 신소재공학과
육종민 교수
Sodium-Ion Storage Materials
Electron Microscopy
Solid-State Lithium-Ion Batteries
발행물
컨퍼런스
3J. M. Yuk, D. I. Son, T. W. Kim, W. K. Choi
2007
,
Annealing effects on the microstructural properties of ZnO thin films grown on n-InP (100) substrates
2J. M. Yuk, J. W. Shin, J. Y. Lee, D. I. Son, W. K. Choi, M. Jung, J. I. Jung, and T. W. Kim
Defect formation mechanisms in the interfacial layer
Asian-Pacific Conference on Surface Science & Engineering (SSE2006)
2006
Defect formation mechanisms in the interfacial layer due to thermal treatment between the ZnO thin film and the Si substrate
The 13th International Symposium on the Physics of Semiconductors and Applications-2006
Effect of thermal annealing on the formation and the microstructural properties of the interfacial layer between ZnO thin films and n-Si (001) substrates
