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전체 논문

46

41

Oxygen migration in TiO2-based higher-k gate stacks
김상범, Brown, SL, Rossnagel, SM, Bruley, J, Copel, M, Hopstaken, MJP, Narayanan, V, Frank, MM
JOURNAL OF APPLIED PHYSICS, 201003

42

Thermal Boundary Resistance Measurements for Phase-Change Memory Devices
김상범, Reifenberg, JP, Chang, KW, Panzer, MA, Rowlette, JA, Asheghi, M, Wong, HSP, Goodson, KE
IEEE ELECTRON DEVICE LETTERS, 201001

43

Scaling the MOSFET gate dielectric: From high-k to higher-k?
김상범, Frank, MM, Brown, SL, Bruley, J, Copel, M, Hopstaken, M, Chudzik, M, Narayanan, V
MICROELECTRONIC ENGINEERING, 200901

44

Integrating phase-change memory cell with Ge nanowire diode for crosspoint memory-experimental demonstration and analysis
김상범, Zhang, Y, McVittie, JP, Jagannathan, H, Nishi, Y, Wong, HSP
IEEE TRANSACTIONS ON ELECTRON DEVICES, 200809

45

Thickness and stoichiometry dependence of the thermal conductivity of GeSbTe films
김상범, Reifenberg, JP, Panzer, MA, Gibby, AM, Zhang, Y, Wong, S, Wong, HSP, Pop, E, Goodson, KE
APPLIED PHYSICS LETTERS, 200709

46

Analysis of temperature in phase change memory scaling
김상범, Philip, HS
IEEE ELECTRON DEVICE LETTERS, 200708