발행물
컨퍼런스
International Conference on Advanced Electromaterials 2021
1970
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A Prediction of next-generation device characteristics using random forest regression
International Conference on Advanced Electromaterials 2019
Recoradable high on-current of germanium-source tunneling field-effect transistors with gate-all-around structures
E-MRS 2019 Spring Meeting
Modeling and optimization of feedback field-effect transistors using TCAD simulation
2018 International Symposium on VLSI Technology, Systems and Application
Electrical Characteristics of gate-all-around MOSFET ring oscillators using TCAD simulation
E-MRS 2017 Fall Meeting
Propagation delay characteristics of sub-10nm gate-all-around nanowire MOSFET Inverters