Talos™ F200i Scanning Transmission Electron Microscope (S/TEM)

Talos™ F200i is a flexible and compact 200 kV FEG Scanning Transmission Electron Microscope (S/TEM), which is designed for fast, precise and quantitative characterization of nano-materials. It enables nano-analysis of materials based on high data quality, fast acquisition, and simplified, easy and automated operation. Talos F200i is equipped with the 4k x 4k CMOS Camera for both low and high-dose applications. In addition, it combines outstanding  quality  in  high-resolution  STEM  and  TEM  imaging  with  dual Energy Dispersive X-ray Spectroscopy (EDS). This dual EDS is made for such situations, where limited signal is available for instance the case when analyzing very sensitive samples.

Talos™ F200i

Talos™ F200i is a flexible and compact 200 kV FEG Scanning Transmission Electron Microscope (S/TEM), which is designed for fast, precise and quantitative characterization of nano-materials. It enables nano-analysis of materials based on high data quality, fast acquisition, and simplified, easy and automated operation. Talos F200i is equipped with the 4k x 4k CMOS Camera for both low and high-dose applications. In addition, it combines outstanding  quality  in  high-resolution  STEM  and  TEM  imaging  with  dual Energy Dispersive X-ray Spectroscopy (EDS). This dual EDS is made for such situations, where limited signal is available for instance the case when analyzing very sensitive samples.