New multivariate kernel density estimator for uncertain data classification
Kim, B., Jeong, Y. S.*, Jeong, M. K.
Annals of Operations Research, 2021
12
A dynamic graph-based approach to ranking firms for identifying key players using inter-firm transactions
Tosyali, A., Choi, J., Kim, B.*, Lee, H., Jeong, M. K.*
Annals of Operations Research, 2021
13
Methodology for assessing the contribution of knowledge services during the new product development process to business performance
Choi, J., Kim, B.*, Han, C. H., Hahn, H., Park, H., Yoo, J., Jeong, M. K.
Expert Systems with Applications, 2021
14
Integrating machine learning, radio frequency identification, and consignment policy for reducing unreliability in smart supply chain management
Sardar, S. K., Sarkar, B., Kim, B*.
Processes, 2021
15
A generalised uncertain decision tree for defect classification of multiple wafer maps
Kim, B., Jeong, Y. S., Tong, S. H., Jeong, M. K.*
International Journal of Production Research, 2020
16
Maintenance optimization for repairable deteriorating systems under imperfect preventive maintenance
Lee, J., Kim, B., Ahn, S.*
Mathematics, 2019
17
Data mining-based variable assessment methodology for evaluating the contribution of characteristics of knowledge services of a public research institute to business performance of firms
Choi, J., Kim, B., Jeong, Y., Han, H., Yoo, J., Jeong, M. K.*
Expert Systems with Applications, 2017
18
Two phase edge outlier detection model for technology opportunity discovery
Kim, B., Gazzola, G., Lee, J. M., Kim, Coh, B. Y., Jeong, M. K.*
Scientometrics, 2017
19
Step-down spatial randomness test for detecting abnormalities in DRAM wafers with multiple spatial maps
Kim, B., Jeong, Y. S., Tong, S. H., Chang, I. K., Jeong, M. K.*
IEEE Transactions on Semiconductor Manufacturing, 2016
20
Patent clustering and outlier ranking methodologies for attributed patent citation networks for technology opportunity discovery
Rodriguez, A., Tosyali, A., Kim, B., Choi, J., Lee, J. M., Coh, B. Y., Jeong, M. K.*