REGULARIZING ACTIVATIONS IN NEURAL NETWORKS VIA DISTRIBUTION MATCHING WITH THE WASSERSTEIN METRIC

Maintenance Optimization for Repairable Deteriorating Systems under Imperfect Preventive Maintenance

A generalised uncertain decision tree for defect classification of multiple wafer maps

Estimating technology lifetime based on a generalized probabilistic model

Data mining-based variable assessment methodology for evaluating the contribution of knowledge services of a public research institute to business performance of firms

Two-phase edge outlier detection method for technology opportunity discovery

실물옵션 기반 기술가치 평가모델 정교화와 변동성 유효구간에 관한 연구

Patent Clustering and Outlier Ranking Methodologies for Attributed Patent Citation Networks for Technology Opportunity Discovery

Step-Down Spatial Randomness Test for Detecting Abnormalities in DRAM Wafers with Multiple Spatial Maps

Quantifying the Risk Level of Functional Chips in DRAM Wafers