발행물

논문
컨퍼런스

전체 논문

210

181

Initial stages of nickel oxide growth on Ag(001) by pulsed laser deposition
S. H. Phark, Young Jun Chang, Tae Won Noh, J.-S. Kim
Physical Review B, 2009

182

Localized electronic states induced by defects and possible origin of ferroelectricity in strontium titanate thin films
Kim, YS (Kim, Y. S.), Kim, J (Kim, J.), Moon, SJ (Moon, S. J.), Choi, WS (Choi, W. S.), Chang, YJ (Chang, Y. J.), Yoon, JG (Yoon, J. -G.), Yu, J (Yu, J.), Chung, JS (Chung, J. -S.), Noh, TW (Noh, T. W.)
APPLIED PHYSICS LETTERS, 2009

183

Interfacial reactions and resistive switching behaviors of metal/NiO/metal structures
S. H. Phark, Ranju Jung, Young Jun Chang, Tae Won Noh, Dongwook Kim
Applied Physics Letters, 2009

184

Fundamental Thickness Limit of Itinerant Ferromagnetic<mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" display="inline"><mml:msub><mml:mi>SrRuO</mml:mi><mml:mn>3</mml:mn></mml:msub></mml:math>Thin Films
Young Jun Chang, Choong H. Kim, S. H. Phark, Y. S. Kim, Jaejun Yu, Tae Won Noh
Physical Review Letters, 2009

185

Electrical Properties of SrRuO₃Thin Films with Varying c-axis Lattice Constant
C. U. Jung, Young J. Chang, Jin I Kim
Journal of Magnetics, 2008

186

Electric-pulse-induced local conducting area and joule heating effect in VO2/Al2O3 films
J.S. Lee, Michele Ortolani, Josef Kouba, Alexander Firsov, Young Jun Chang, Tae Won Noh, U. Schade
Infrared Physics & Technology, 2008

187

Magnetic properties of insulating RTiO3 thin films
Seung Chul Chae, Young Jun Chang, Dongwook Kim, B.W. Lee, In‐Hwan Choi, C. U. Jung
Journal of Electroceramics, 2008

188

Control of silicidation in HfO2/Si(100) interfaces (vol 86, art. no. 041913, 2005)
Cho, DY, Park, KS, Choi, BH, Oh, SJ, Chang, YJ, Kim, DH, Noh, TW, Jung, R, Lee, JC, Bu, SD
APPLIED PHYSICS LETTERS, 2007

189

Transport and microscopic investigations on the electric-pulse-induced phase transition of VO2 films
J.S. Lee, Michele Ortolani, A. Ginolas, Young Jun Chang, Tae Won Noh, U. Schade
Physica C Superconductivity, 2007

190

Surface vs. Bulk Characterizations in Electronic Inhomogeneity of a VO2 thin film.
Young Jun Chang, Junyi Yang, T.W. Noh, D.-W. Kim, J.-S. Chung, Evan K Insani Song-yul Oh, B. Kahng
Bulletin of the American Physical Society, 2007