발행물

전체 논문

47

1

BugOss: A Regression Bug Benchmark for Empirical Study of Regression Fuzzing Techniques
J. Kim, S. Hong
IEEE International Conference on Software Testing, Verification and Validation (ICST), 2023

2

Learning-based Mutant Reduction using Fine-grained Mutation Operators
Y. Kim, S. Hong
Software Testing, Verification and Reliability (STVR), 2022

3

Inferring Fine-grained Traceability Links between Javadoc Comment and JUnit Test Code
J. Kim, S. Hong
the 38th IEEE International Conference on Software Maintenance and Evolution (ICSME), 2022

4

Predictive Mutation Analysis via Natural Language Channel in Source Code
J. Kim, J. Jeon, S. Hong, S. Yoo
ACM Transactions on Software Engineering and Methodology (TOSEM), 2022

5

Repairing Fragile GUI Test Cases Using Word and Layout Embedding
J. Yoon, S. Chung, K. Shin, J. Kim, S. Hong, S. Yoo
the 15th IEEE International Conference on Software Testing, Verification and Validation, 2022

6

Improving Configurability of Unit-level Continuous Fuzzing: An Industrial Case Study with SAP HANA
H. Yoo, J. Hong, B. Lucas, D. W. Hwang, S. Hong
The 36th IEEE/ACM International Conference on Automated Software Engineering (ASE), 2020

7

Empirical Study of Effectiveness of EvoSuite on the SBST 2020 Tool Competition Benchmark
R. S. Herlim, S. Hong, Y. Kim, M. Kim
the 13th Symposium on Search-Based Software Engineering (SSBSE), 2012

8

DeMiner: Test Generation for High Test Coverage through Mutant Exploration
Y. Kim, S. Hong
Software Testing, Verification and Reliability (STVR), 2021

9

Threats to Validity in Evaluating Mutation-based Fault Localization
J. Jeon, S. Hong
International Conference on Software Engineering (ICSE),

10

Target-Driven Compositional Concolic Testing with Function Summary Refinement for Effective Bug Detection
Y. Kim, S. Hong, M. Kim
ACM Joint European Software Engineering Conference and Symposium on the Foundations of Software Engineering (ESEC/FSE), 2019