The 33rd Korean Conference on Semiconductors

Characteristics of High-Temperature FET Based Static Random Access Memory

2026

The 33rd Korean Conference on Semiconductors

Radiation-Induced Transient Characteristics of Feedback FETs

2026

The 33rd Korean Conference on Semiconductors

Effects of Word-line Profiles on Electrical Variationof 3D Channel-Stacked NAND Flash Memory

2026

The 33rd Korean Conference on Semiconductors

Capacitive Time-Domain Ferroelectric Content-Addressable Memory for High-Density and Highly Robust In-Memory Nearest Neighbor Search

2026

The 33rd Korean Conference on Semiconductors

Reconfigurable Logic Gates Using a Single Ferroelectric-Tunnel-FET

2026