발행물
컨퍼런스
American Vacuum Society 60th International Symposium & Exhibition
2013
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Investigation of dual-active-layered zinc-tin-oxide/indium-gallium-zinc-oxide thin-film transistors with the durability of the chemical damage
The Effect of High-Pressured N2 Annealing in NiOx based Resistive Random Access Memory
UV radiation effect on electrical characteristics of passivated IGZO TFTs
Effects of high pressure on InGaZnO thin film
13th International Meeting on Information Display
Optical and Electrical propertiesof PbS colloidal quantum dot thin films with inter-dot distances