Vertically gradual oxygen vacancies in Indium-Zinc-Oxide by controlling redox reactions via sequential high pressure annealing

2014

Effect of interface location within solution-processed In-Ga-Zn-O thin-film transistors

2015

Enhancement in Positive Bias Stress Stability of In-Ga-Zn-O Thin-Film Transistors with Vertically Graded-Oxygen-Vacancy Active Layer

2015

Interface Location Controlled Dual Stacked Solution-Processed In-Ga-Zn-O Thin Film Transistors for Improved Electrical Performances

2015

Investigation of annealing temperature for solution-processed yttrium oxide passivation layer on a-IGZO thin-film transistors

2015