발행물
컨퍼런스
제18회 한국반도체학술대회
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In2Se3 나노선 합성 및 이를 이용한 상변화 메모리소자의 전기적 특성 분석
광자기술학술회의(Photonics Confernce 2010)
Photonic Quantum Ring from Quantum Corral of Whispering Cave Mode
IEEE Nanotechnology Materials and Devices conference
Reliability properties in sub-50 nm high performance high-k.metal gate stacks SiGe pMOSFETs
International Conference on Solid State Devices and Materials
C-V Characteristics and Analysis of Undoped Gate-All-Around Nanowire FET Array
IEEE International Reliability Physics Symposium
Characterization of Gate-All-Around Si-NWFET, including Rsd, Cylindrical Coordinate Based 1/f Noise and Hot Carrier Effects