발행물

전체 논문

184

71

Characteristics of the Series resistance Extracted from Si-Nanowire FETs using the Y-function Technique
R.-H. Baek, C.-K. Baek, S. W. Jung, Y. Y. Yeoh, D. W. Kim, J.-S. Lee, D. M. Kim, Y.-H. Jeong
IEEE Transactions on Nanotechnology, 2010

72

A Sub-micron Metallic Electrothermal Gripper
D. S.-W. Park, A. K. Nallani, D. Cha, G.-S. Lee, M. J. Kim, G. Skidmore, J.-B. Lee, J.-S. Lee
Microsystem Technologies, 2010

73

Single ZnO Nanowire Based High-Performance Field Effect Transistors (FETs)
Y. K. Park, A. Umar, J. S. Kim, H. Y. Yang, J.-S. Lee, Y. H. Hahn
Journal of Nanoscience and Nanotechnology, 2009

74

Forming carbon nanotube composite by directly coating forests with inorganic materials using low pressure chemical vapor deposition
A. Chandrashekar, S. Ramachandran, G. Pollack, J.-S. Lee, G. S. Lee, L. J. Overzet
Thin Solid Films, 2008

75

Impact of Electron and Hole Trap Profiles in BE-TOX on Retention Characteristics of 3D NAND Flash Memory
Yoon, Gilsang, Go, Donghyun, Park, Jounghun, Kim, Donghwi, Kim, Jongwoo, An, Ukju, Kim, Jungsik, Lee, Jeong-Soo, Kong, Byoung Don
IEEE Transactions on Nanotechnology, 202410

76

Novel Dummy Cell Programming Scheme to Improve Retention Characteristics in 3-D NAND Flash Memory
Kim, D., Yoon, G., Go, D., Park, J., Kim, J., Lee, J.-S.
IEEE Transactions on Electron Devices, 202408

77

Influence of Surface Treatments on Urea Detection Using Si Electrolyte-Gated Transistors with Different Gate Electrodes
W. Choi, S. Shin, J. Do, J. Son, Kim, K, LEE, JS
Micromachines, 202405

78

Effect of Quasi-One-Dimensional Properties on Source/Drain Contacts in Vertical Nanowire Field-Effect Transistors (VNWFETs)
Park, I, Choi, J, Kim, J, Kong, BD, Lee, JS
Micromachines, 202404

79

Sensing Characteristics of SARS-CoV-2 Spike Protein Using Aptamer-Functionalized Si-Based Electrolyte-Gated Field-Effect Transistor (EGT)
Shin, S, Kim, S, Choi, W, Do, J, Son, J, Kim, K, Jang, S, Lee, JS
Biosensors, 202403

80

Effects of Poly-Si Grain Boundary on Retention Characteristics under Cross-Temperature Conditions in 3-D NAND Flash Memory
LEE, JS, U. An, G. Yoon, D. Go, J. Park, D. Kim, J. Kim
Micromachines, 202312