발행물
컨퍼런스
대한금속,재료학회
2007
,
Structural characteristics of YMn2-xFexO5-δ
동시관찰용 인장 홀더 디자인과 응용- 실시간 Dislocation 반응 과정의 관찰
Electrical properties and chemical structures of atomic layer deposited HfCxNy films using TDMAHf and TEMAHf precursors
sematech
The role of carbon in reducing resistivity of low temperature metal organic chemical vapor deposited HfCxNy for gate metal electrode
Microscopy society of America
Morphology of GaN Microrods Grown on Dot Patterned substrate