발행물
컨퍼런스
The 20th International Microscopy Congress (IMC20)
2023
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A comprehensive nano-scale characterization of amorphous carbon films through STEM-EELS and 4D-STEM
GPU-based fast reconstruction and DL-based feature extraction for EELS tomography
Unveiling the grain size-dependency of intragrain planar defects in the metal halide perovskites by ultralow dose transmission electron microscopy
Revealing the Resistive Switching Mechanism in Transition Metal Oxide Film Using In-situ Biasing TEM
Microscopy and Microanalysis (M&M) 2023
Charge modulations in nanostructures revealed by 4D-STEM