발행물

전체 논문

132

1

Robust wavefront sensing method based on machine learning for optical thickness profiling
Hwan Kim, Yangjin Kim*, Yusuke Ito, Naohiko Sugita
Journal of Mechanical Science and Technology, 2025

2

Deep learning-based phase aberration estimation for ultra-precise silicon wafer metrology
Hwan, Kim, Yangjin Kim*, Yusuke Ito, Naohiko Sugita, Mamoru Mitsuishi
International Journal of Precision Engineering and Manufacturing – Green Technology, 2025

3

Development of volumetric accuracy enhancement method for a 5-axis machine tool based on sensitivity analysis and extraction algorithm
Sungtae Kim, Yangjin Kim*, Heung Ki Jeon, Tae Soo Jang, Chang Ho Lee, Naohiko Sugita
International Journal of Precision Engineering and Manufacturing, 2025

4

Quality enhancement of interferometric fringe pattern based on deep learning-based denoising of combined noise
Juncheol Bae, Yangjin Kim*, Yusuke Ito, Naohiko Sugita, Mamoru Mitsuishi
Precision Engineering, 2025

5

Precise three-surface interferometry for thickness separation in blank masks
Hwan Kim, Yangjin Kim*, Yusuke Ito, Naohiko Sugita
International Journal of Precision Engineering and Manufacturing, 2025

6

Glass thickness testing using Fizeau interferometer with suppression of environmental factors
Jurim Jeon, Yangjin Kim*, Yusuke Ito, Naohiko Sugita, Kenichi Hibino
Precision Engineering, 2025

7

ChatCNC: Conversational machine monitoring via large language model and real-time data retrieval augmented generation
Jurim Jeon, Yuseop Sim, Hojun Lee, Changheon Han, Dongjun Yun, Eunseob Kim, Shreya Laxmi Nagendra, Martin Byung-Guk Jun, Yangjin Kim, Sang Won Lee, Jiho Lee*
Journal of Manufacturing Systems, 2025

8

Development of Gaussian window function for precision topography of silicon-wafer surface using wavelength-modulation interferometry
Juncheol Bae, Yangjin Kim*, Yusuke Ito, Naohiko Sugita
International Journal of Precision Engineering and Manufacturing, 2024

9

Design of phase-reconstruction algorithm: insensitivity to intensity modulation
Yangjin Kim*, Sungtae Kim, Habeom Lee, Songkil Kim, Sang Hu Park, Yusuke Ito, Naohiko Sugita
Journal of Mechanical Science and Technology, 2024

10

Scanning interferometric phase-calculation formula for simultaneous topographic profiling of thickness and surface of optical flats
Wonjun Bae, Yangjin Kim*, Seokyoung Ahn, Yusuke Ito, Naohiko Sugita
Optics and Laser Technology, 2024