발행물
컨퍼런스
CIRP Conference on Surface Integrity
2026
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Nanometer-scale polishing of diamond by pulsed laser using feedback from interferometric topography measurement
SPIE Photonics West
Single-shot phase extraction using deep learning for noiseless dynamic surface metrology
Absolute thickness measurement of transparent glass using optical interferometer and deep learning
Submicrometer-scale 3D grinding of diamond by ultrashort pulse laser with in-process interferometric topography measurement
International Conference of Asian Society for Precision Engineering and Nanotechnology (ASPEN)
2025
Development of volumetric accuracy enhancement method for 5-axis machine tool based on sensitivity analysis and weight assignment method