발행물
컨퍼런스
International Conference of Asian Society for Precision Engineering and Nanotechnology (ASPEN)
2025
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Development of robust phase-iterative algorithm for measuring surface shape of silicon wafer using Kalman filter
Simultaneous geometric property measurement of a transparent plate through deep learning-based pattern decomposition and phase extraction
Deep-learning based single-frame phase demodulation via ideal signal prediction
Deep-learning based absolute optical thickness measurement of glass substrate
International Symposium on Precision Engineering and Sustainable Manufacturing (PRESM)
Deep-learning based normalizing one-frame phase demodulation method for real-time interferometric measurement