발행물
컨퍼런스
HANA Micron
2016.11
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Invited Seminar – “Signal/Power Integrity (SI/PI) Fundamentals”
SK Hynix
2016.08
Tutorial – “High-sensitivity RFI Measurement Techniques & Component-level EMI Evaluation Methods”
Samsung Electronics
2016.07
Invited Seminar – “Component-level RE/RFI Evaluation Methods”
EMC Korea 2016
EMCIS scholarship recipient (EMCIS EMC 장학생)
2016.06
Invited Seminar – “High-sensitivity RFI Noise Measurement Technologies”