발행물
컨퍼런스
Samsung Electronics
2015.05
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Invited Seminar – “High-sensitivity RFI Noise Measurement”
Samsung Advanced Technology Training Institute
2015.02
Invited Lecture on Advanced SI/EMC Design
IEIE RF/Analog Circuit Workshop
2014.09
Invited Seminar – “Component-level EMI Evaluation for Mobile Devices”
KIEES Academy Summer Workshop
2014.08
Invited Seminar – “High-sensitivity EM Probe Design based on Conventional PCB Process”
2025 한국전자파학회 동계종합학술대회
노이즈 오류 주입에 따른 디스플레이 장치의 전자기 내성 평가법 설계