A Two-Line Time-Domain Gating Method for Characterization of Test Fixture With via Hole Discontinuity
Cho, J[Cho, Jaeyong], Kim, BS[Kim, Byung-Sung], Jeong, J[Jeong, Jonghyuk], Kim, J[Kim, Junseong], Kim, K[Kim, Kibeom], Hwang, K[Hwang, Karam], Lee, H[Lee, Hwiseob], Jeung, S[Jeung, Seungil], Ahn, S[Ahn, Seungyoung]
IEEE MICROWAVE AND WIRELESS COMPONENTS LETTERS, 201710