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·2020
Design of TEG Module for Memristor Device Verification for Neuromorphic Chips
Hongzhou Jin, JinSol Cha, Dogyu Lee, Pan-Bong Ha, Young‐Hee Kim, Hoyoung Yoo
2020 International Conference on Electronics, Information, and Communication (ICEIC)
초록

In this study, we plan to design an RRAM TEG module for new device verification using an array size of 512 rows x 512 columns using 1T1R active RRAM cells based on MagnaChip process technology. We also plan to use 3.3V devices as select transistors used in TEG modules, which are analog circuits, and will be used for new memristor devices.

키워드
Neuromorphic engineeringMemristorRowResistive random-access memoryTransistorProcess (computing)Computer scienceMaterials scienceOptoelectronicsPhysics
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2020

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