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*2026년 기준 최근 6년 이내 논문에 한해 Impact Factor가 표기됩니다.
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인용수 0
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2025알루미늄 패드 두께와 팔라듐 함량에 따른 금 와이어 본딩의 고온신뢰성 연구
김상엽, 박현준), 신종진), 송오성
IF 1.4 (2025)
대한금속·재료학회지
The bonding characteristics and high-temperature reliability of gold bonding wires wereinvestigated with respect to the thickness of the aluminum pads and the addition of palladium. Samples ofhigh-purity gold (99.99%, 4N) and gold with 1% palladium added (99% purity, 2N) were processed into15.3 m diameter ultra-fine wires through wire drawing and bonded to aluminum pads with thicknesses of1 m and 5 m using ball bonding equipment. The reliability at elevated temperatures was evaluated byannealing at 175oC for up to 1,000 hours. Micro-structural and intermetallic compound (IMC) phase changesat the vertical cross-sections of bonded areas were characterized using SEM-EDS at specific time intervals.
For 1 m aluminum pads, both 4N and 2N gold wires initially exhibited identical bonding ball morphologies.
Voids began to form at the lateral sections after 250 hours, accompanied by the formation of Au8Al3 and Au4Alphases. Despite these observations, stable bonding was maintained up to 1,000 hours, with the palladiumaddition proving advantageous in terms of bonding strength. On the other hand, for 5 m aluminum pads,IMCs in the 4N wire were stabilized as Au8Al3, maintaining the bond interface for up to 1,000 hours. However,for the 2N wire, significant voids were observed beneath the bond interface as early as 250 hours. These voidswere attributed to the incorporation of palladium, which caused the growth of AuAl2 into Au2Al, leading torapid shrinkage due to phase transformation occurring at a very early stage. Therefore, the addition ofpalladium is less favorable when using 5 m thick aluminum pads, as it induces different inter-diffusionphenomena compared to 1 m pads, resulting in void formation.
https://doi.org/10.3365/kjmm.2025.63.12.946
Intermetallic
Aluminium
Palladium
Annealing (glass)
Wire bonding
Accumulative roll bonding
Shrinkage
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인용수 2
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2024은합금 와이어의 팔라듐 함량에 따른 물성 변화와 고습신뢰성
김상엽, 전성민), 박현준), 김승현), 신종진), 송오성
IF 1.4 (2024)
대한금속·재료학회지
This study investigated changes in electrical and mechanical properties, as well as the highhumidity reliability of 18 m-diameter silver alloy wires with palladium contents of 1.1, 2.5, 3.0, and 4.0 wt%,for semiconductor packaging. We also compared the formation of Free Air Ball (FAB) and the high humidityreliability of joints in a reducing atmosphere with 4N (99.99%) gold wire of the same diameter. The wireresistance and hardness values were measured using a 4-point probe and a micro-hardness tester. The FABformed in atmospheric and reducing atmospheres, as well as the high humidity reliability after bonding, wereanalyzed using field emission scanning electron microscopy, energy dispersive spectrometry, and a mechanicalstrength analyzer. As the palladium content increased in the silver alloy wire, the electrical resistanceincreased, showing a similar level to gold wire up to 2.5 wt%, after which it exhibited a further increase. Thehardness values also increased sharply, but the rate of increase slowed down after 2.5 wt%. FAB exhibitedexcellent sphericity across the entire range of palladium content. After bonding, a uniform distribution ofpalladium was observed at the joint interface. The high humidity reliability showed improvement withincreasing palladium content. Palladium 1.1 wt% exhibited differences compared to 2.5 and 3.0 wt%, andfurther improvement was observed with an increase to 4.0 wt%. This is attributed to the incorporation ofpalladium into the vulnerable Ag3Al intermetallic compound, resulting in the formation of a corrosionresistant (AgPd)3Al phase. As a result, micro-diameter silver alloy wires with a diameter of 18 m or lessdemonstrated stable FAB formation, bonding processes, and properties that make them candidates to replaceconventional gold wires, particularly under conditions with palladium content exceeding 2.5 wt%.
http://dx.doi.org/10.3365/kjmm.2024.62.9.705
Palladium
Materials science
Intermetallic
Alloy
Humidity
Scanning electron microscope
Relative humidity
Electrical resistance and conductance
Metallurgy
Composite material
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인용수 1
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2022저온 소결 처리된 SnO2 전자전달층을 가진 페로브스카이트 태양전지의 물성
김호준, 이용욱, 오영준, 김광배, 송오성
IF 1.2 (2022)
대한금속·재료학회지
This study investigated the photovoltaic properties and microstructure of perovskite solar cells (PSCs) with an ITO/SnO2/perovskite/HTL/Au electrode configuration, developed with varying sintering temperatures (100~200°C). The goal was to use SnO2 ink as the electron transport layer (ETL) by lowtemperature sintering. TGA-DTA analysis was conducted to determine the optimum sintering temperature of the SnO2 ink and the photovoltaic properties were examined by solar simulator analysis. To analyze the microstructure, a 3D profiler, optical microscope, and scanning electron microscopy (SEM) were used. The TGA-DTA analysis results show that SnO2 ink was effectively sintered at the low temperature of 80°C and above. As for the photovoltaic(PV) properties, the PV efficiency was approximately 15% at 120~150°C, and increased to a maximum of 17.16% at 180°C, and then fell to 12% at 200°C. The RMS value, a representation of surface roughness, of the SnO2 layer according to sintering temperature incrementally decreased, reached its lowest at 180°C, before finally increasing. The microstructure analysis showed that the perovskite layer formed on the SnO2 at a sintering temperature of 180°C had a relatively greater grain size of 402 nm and a thickness of 432 nm, thereby improving the PSC’s PV properties. These results suggest it is possible to implement a PCS with SnO2 ETL by low temperature sintering process.
https://doi.org/10.3365/kjmm.2022.60.7.545
Sintering
Materials science
Microstructure
Perovskite (structure)
Scanning electron microscope
Layer (electronics)
Photovoltaic system
Surface roughness
Grain size
Chemical engineering